FTIRピーク解釈
What absorbs at 930 cm⁻¹ in an FTIR spectrum?
A band near 930 cm⁻¹ can point to several functional groups. Below are the most likely assignments, ranked by how much published evidence supports each — every one traceable to literature (DOI) and cross-validated against our 130,000+ reference spectra and knowledge graph.
Backed by 8 cited sources
可能性のある官能基アサイン
| 官能基 | 裏付け事実 | 引用元 | 最高信頼度 |
|---|---|---|---|
| Silicon-oxygen (Si-O) | 6 | 5 | 0.9 |
| Siloxane (Si-O-Si) | 2 | 2 | 0.9 |
| Aldehyde (CHO) | 2 | 2 | 0.9 |
| Ammonium | 2 | 2 | 0.8 |
| Hydroxyl (O-H) | 1 | 1 | 0.9 |
| C-O single bond | 1 | 1 | 0.9 |
| Sulfate (SO4) | 1 | 1 | 0.9 |
| Alkyl C-H | 1 | 1 | 0.7 |
| N h | 1 | 1 | 0.6 |
| Oxygen heterocycle | 1 | 0 | 0.9 |
ランキングは蓄積された文献証拠を反映しており、単一の権威あるルールではありません。常にサンプルのコンテキストと照合して確認してください。
これらのアサインの根拠となる文献
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Silicon-oxygen (Si-O) 信頼度 0.9
“Si-O stretching vibrations”
Chabane 等 - 2009 - Characterization of SiOF thin films deposited by P DOI: 10.4028/www.scientific.net/MSF.609.59 -
Sulfate (SO4) 信頼度 0.9
“Peak at 930 for ester sulfate groups.”
Fauzi 等 - 2020 - Characterization, Disintegration, and Dissolution DOI: 10.1155/2020/3565931 -
信頼度 0.9
“Explicit: 'γ-Al 930 for 2O' (likely γ-Al2O3)”
Lefez 等 - 2007 - Fourier transform infrared reflection absorption s DOI: 10.1016/j.tsf.2007.06.126 -
Silicon-oxygen (Si-O) 信頼度 0.9
“Clear signature of Ti-O-Si”
Sarkar 等 - 2007 - Dielectric properties of sol-gel derived high-k ti DOI: 10.1016/j.tsf.2006.11.155 -
C-O single bond 信頼度 0.9
“Typical starch peak assigned to C-O stretch.”
Velasquez-Barreto 等 - 2019 - Esterification and Characterization of Starch From DOI: 10.1002/star.201800101 -
Aldehyde (CHO) 信頼度 0.9
“Explicit assignment in text.”
Yu - 2011 - Microprobing the molecular spatial distribution an DOI: 10.1107/S0909049511023727 -
Aldehyde (CHO) 信頼度 0.9
“Explicitly assigned to CHO”
Yu 等 - 2007 - Rapid characterization of molecular chemistry, nut DOI: 10.1107/S0909049507014264 -
Silicon-oxygen (Si-O) 信頼度 0.9
“Characteristic of SiO4 bands of glassy network”
Zitani 等 - 2014 - Crystallization, Sinterability and Microwave Diele DOI: 10.1007/s13391-013-3103-5
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