How can you identify SiO from FTIR?
This page summarizes the recurring FTIR evidence reported for SiO, including the most frequent peaks, supporting functional groups, and literature-backed interpretation patterns. It is a structured evidence page, not a claim of automatic single-spectrum certainty.
Backed by 39 cited sources
Quick answer
SiO is usually reported with a recurring pattern of peaks and functional-group evidence. The most useful approach is to cross-check at least two characteristic peaks before treating it as a match, then verify whether the full spectrum still fits the same material family.
Peak interpretation
Possible materials / groups
| Functional group | Evidence |
|---|---|
| Silicon-oxygen (Si-O) | 61 |
| Siloxane (Si-O-Si) | 44 |
| Silicon (Si) | 43 |
| Hydroxyl (O-H) | 26 |
| Metal oxygen | 17 |
| Methacrylate | 15 |
| Acetate | 15 |
| Methoxy (OCH3) | 14 |
Spectrum logic
The logic here is evidence aggregation: repeated literature mentions of SiO, repeated peak positions, and repeated functional-group associations. A strong material hypothesis should still be supported by multiple peaks that agree with each other, not by one headline band alone.
Real-world usage
This page is designed for polymer identification, incoming-material QC, unknown plastic analysis, recycled-content review, and literature-backed interpretation of reference spectra.
Common mistakes
- Calling a material match too early because one famous peak is present.
- Ignoring sample prep, fillers, oxidation, water, or additives that can change the apparent pattern.
- Using literature evidence without checking whether your own sampling mode and spectrum quality are comparable.
Verification advice
Use DSC, GC-MS, or TGA to validate the material hypothesis when the peak pattern is ambiguous or mixed.
Literature behind this page
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confidence 4.8
SiO
Swe 等 - 2019 - Fabrication of Sol-Gel derived New Quaternary Sili DOI: 10.1063/1.5089369 -
confidence 3.6
SiO
Polymerization of monomers initiated by silyl centers in SiO deposits prepared by pulsed laser ablation DOI: 10.1002/app.24802 -
confidence 3.6
SiO
Fourier transform infrared spectroscopic study of gamma irradiated SiO<sub>2</sub> nanoparticles DOI: 10.1142/S0217979218500741 -
confidence 3.6
SiO
Lee 和 Park - 1996 - Effect of fluorine on dielectric properties of SiO DOI: 10.1063/1.363512 -
confidence 3.6
SiO
Structural and optoelectronic properties of p-type SiO:H films deposited in transition zone DOI: 10.7498/aps.66.196801 -
confidence 3.6
SiO
Luminescence characteristics of O<sup>6+</sup> ion beam and <i>γ</i>-ray irradiated Ca<sub>9</sub>La(PO<sub>4</sub>)<sub>5</sub>(SiO<sub>4</sub>)F<sub>2</sub>:Eu phosphor DOI: 10.1080/10420150.2020.1737696 -
confidence 3.6
SiO
Comparison of FTIR Transmission Spectra of Thermally and LPCVD SiO[sub 2] Films Grown by TEOS Pyrolysis DOI: 10.1149/1.1676725 -
confidence 3.6
SiO
Surface-Modified TiO<sub>2</sub>@SiO<sub>2</sub> Nanocomposites for Enhanced Dispersibility and Optical Performance to Apply in the Printing Process as a Pigment DOI: 10.1021/acsomega.3c02679 -
confidence 3.6
SiO
Signal Enhanced FTIR Analysis of Alignment in NAFION Thin Films at SiO<sub>2</sub> and Au Interfaces DOI: 10.1021/acsmacrolett.5b00800 -
confidence 3.6
SiO
Optical and Structural Properties of Silicon Nanocrystals Embedded in SiO<sub><i>x</i></sub> Matrix Obtained by HWCVD DOI: 10.1155/2012/368268
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