What absorbs at 797 cm⁻¹ in an FTIR spectrum?
A band near 797 cm⁻¹ can point to several functional groups. Below are the most likely assignments, ranked by how much published evidence supports each — every one traceable to literature (DOI) and cross-validated against our 130,000+ reference spectra and knowledge graph.
Backed by 8 cited sources
Risposta rapida
A band near 797 cm⁻¹ is usually interpreted by checking which functional groups repeatedly co-occur there in the literature, then confirming at least one or two additional peaks in the same sample. This page ranks those assignments by accumulated evidence rather than by a single fixed textbook rule.
Possibili assegnazioni di gruppi funzionali
| Gruppo funzionale | Fatti di supporto | Fonti citate | Affidabilità massima |
|---|---|---|---|
| Silicon-oxygen (Si-O) | 7 | 7 | 1,0 |
| Alkyl C-H | 4 | 2 | 1,0 |
| Siloxane (Si-O-Si) | 3 | 3 | 1,0 |
| Silicon carbon | 2 | 2 | 1,0 |
| Ring structure | 1 | 1 | 1,0 |
| Aromatic ring | 1 | 1 | 1,0 |
| Phosphate (PO4) | 1 | 1 | 1,0 |
| Carboxyl (COOH) | 1 | 1 | 1,0 |
| Silicon (Si) | 1 | 1 | 1,0 |
| Metal oxygen | 1 | 1 | 1,0 |
| Hydroxyl (O-H) | 1 | 1 | 1,0 |
| N-O bond | 1 | 1 | 1,0 |
| Carbon dioxide | 1 | 1 | 1,0 |
| Water (H2O) | 1 | 1 | 1,0 |
| Fluorine (C-F) | 1 | 1 | 0,9 |
La classifica riflette le prove bibliografiche accumulate, non una singola regola autorevole. Conferma sempre nel contesto del tuo campione.
Materiali possibili
| Materiale | Picchi di supporto | Gruppi sovrapposti | Fonti citate |
|---|---|---|---|
| SiO2 | 797, 1739, 699 | Silicon-oxygen (Si-O), Alkyl C-H, Siloxane (Si-O-Si) | 1 |
| SiC | 797, 791, 805 | Silicon carbon, Silicon-oxygen (Si-O), Siloxane (Si-O-Si) | 1 |
| montmorillonite | 797, 1637, 523 | Silicon-oxygen (Si-O) | 1 |
| hematite | 797, 1030, 469 | Silicon-oxygen (Si-O), Siloxane (Si-O-Si) | 1 |
| diamond | 797, 1378, 1332 | Alkyl C-H | 1 |
I materiali vengono mostrati solo quando lo stesso pool di letteratura supporta questa banda e almeno un picco caratteristico aggiuntivo.
Logica dello spettro
This band becomes meaningful only when read with its neighboring peaks. In practice, analysts first look at the assignments above, then check whether the same sample also shows other peaks expected for the same structural motif. A lone band near 797 cm⁻¹ is usually not enough for material identification by itself.
Utilizzo nel mondo reale
Questo tipo di richiesta è comune nell＇identificazione dei polimeri, nello screening di plastiche sconosciute, nella risoluzione dei problemi di controllo qualità, nella verifica dei materiali riciclati e nella revisione dell＇assegnazione dei picchi supportata dalla letteratura.
Errori comuni
- Trattare una banda isolata come prova di un materiale senza verificare almeno uno o due picchi di supporto.
- Ignorando la sovrapposizione: più gruppi funzionali possono contribuire vicino allo stesso numero d＇onda.
- Saltare la convalida quando additivi, miscele, ossidazione o contaminazione possono distorcere lo spettro.
Consiglio di verifica
Quando permangono ambiguità, convalida l＇ipotesi con DSC, GC-MS o TGA, specialmente per miscele, campioni degradati e polimeri caricati.
Letteratura dietro queste assegnazioni
-
Water (H2O) affidabilità 1,0
“Inthespectralregion1250-400cm-1ofsoilsfromintermediateBh the spectra of horizon Bh and Bhs, with the exception of the peak at cm-1, 1160 andBhshorizons(Fig.1),wherethemineralphasesKOandTOappear, which disappears due to the very low content”
Clabel 等 - 2020 - Organo-mineral associations in a Spodosol from nor DOI: 10.1016/j.geodrs.2020.e00303 -
Silicon-oxygen (Si-O) affidabilità 1,0
“it holds the major lattice peaks of SiO at 797, 695, 450, and 2 However, this region may overlap with SOM bands (Table 2) as well as with a priori unknown bands of clay minerals and smectite/illite con-”
FTIR photoacoustic spectroscopy for identification and assessment of soil components_ Chernozems and their size fractions DOI: 10.1016/j.pacs.2020.100162 -
Silicon carbon affidabilità 1,0
“film caused by defects and impurities in the diamond For A, cm(cid:1)1 the strong sharp absorptionpeak at 797 is due to SiC formed film at the interface of the due to low diamond nucleation density because no substrate surface pretreatment”
Effect of methane concentration in hydrogen plasma on hydrogen impurity incorporation in thick large-grained polycrystalline diamond films DOI: 10.1016/j.jcrysgro.2015.06.018 -
affidabilità 1,0
“The FTIR spectra of unheated samples (Li-Mt0, Na-Mt0 and Cu-Mt0) showed that there were obvious absorption bands near cm-1, cm-1 cm-1 797 844 and 912 (Figure 3A-C), which presumably correspond to the OH Minerals2022,12,477”
Thermal Migration Behavior of Na+, Cu2+ and Li+in Montmorillonite DOI: 10.3390/min12040477 -
affidabilità 1,0
“cm-1 cm-1, 1605 and 3383-3601 being assigned to the vibrational modes of the deformation IR bands of PTA situated at 523 cm-1, 594 cm-1, 797 cm-1, 891 cm-1, 982 cm-1, 1080 cm-1, 1605 (O corresponds to corner oxygen atoms), W-O e-W stretchin”
The Photoluminescence and Vibrational Properties of Black Phosphorous Sheets Chemically/Electrochemically Functionalized in the Presence of Diphenylamine DOI: 10.3390/polym14214479 -
Silicon (Si) affidabilità 1,0
“The weak absorption band at 797 cm-1 is related to the vibration of the symmetric stretching of the Si-O-Si bonds [37,38].”
Study of Geopolymer Composites Based on Volcanic Ash, Fly Ash, Pozzolan, Metakaolin and Mining Tailing DOI: 10.3390/buildings12081118 -
affidabilità 1,0
“The FTIR spectrum registered on raw umber from Cyprus (sample PK40610) highlights (PK11100 and PK11010) could indicate a high Fe content in the octahedral sheet, possibly the presence of goethite (characteristic peaks at 3190, 898 and 797 c”
Assessment of Easily Accessible Spectroscopic Techniques Coupled with Multivariate Analysis for the Qualitative Characterization and Differentiation of Earth Pigments of Various Provenance DOI: 10.3390/min12060755 -
Silicon carbon affidabilità 1,0
“The peak at 797 corresponds SiC, while the peak 1060 corresponds to SiO 2.”
Criner 等 - 2018 - Quantification of Material State using Reflectance DOI: 10.1063/1.5031610
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