What absorbs at 2080 cm⁻¹ in an FTIR spectrum?
A band near 2080 cm⁻¹ can point to several functional groups. Below are the most likely assignments, ranked by how much published evidence supports each — every one traceable to literature (DOI) and cross-validated against our 130,000+ reference spectra and knowledge graph.
Backed by 4 cited sources
Mögulegar úthlutun virkra hópa
| Virkur hópur | Stuðningsstaðreyndir | Tilvitnuð heimildir | Mesta öryggi |
|---|---|---|---|
| Silicon hydride | 2 | 2 | 1,0 |
| Alkyl C-H | 1 | 1 | 1,0 |
| Carbonyl (C=O) | 1 | 1 | 1,0 |
| Silicon silicon | 1 | 0 | 1,0 |
Röðun endurspeglar uppsöfnuð ritrýnisgögn, ekki eina valdboðsreglu. Staðfestu alltaf í samhengi við sýnið þitt.
Ritlist á bak við þessar úthlutanir
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Carbonyl (C=O) öryggi 1,0
“In the same region, the 2080 cm-1 band appears and is assigned to CO stretching of linear carbonyls adsorbed into Ru0.”
Thermal and Plasma-Assisted CO2 Methanation over Ru/Zeolite: A Mechanistic Study Using In-Situ Operando FTIR DOI: 10.3390/catal13030481 -
Silicon hydride öryggi 1,0
“carconogesis.12, 13 Herein, we present an investigation utilising cm-1 The peak visible at about 2080 is a clear indicator of the silicon nanoparticles (SiNPs) functionalised to contain a cm-1 presence of Si-H band.”
Chao 等 - 2020 - Synthesis and characterisation of isothiocyanate f DOI: 10.1039/C9FD00087A. -
Alkyl C-H öryggi 1,0
“Spectral features of the SZ2080 at 2923 (due to C-H stretching cm-1 cm-1 in alkanes), 1716 (due to the C=O stretching of carbonyl), and 2700 (where there was no specific absorbance in the SZ2080) were selected for the orientation mapping.”
Infrared Polariscopy Imaging of Linear Polymeric Patterns with a Focal Plane Array DOI: 10.3390/nano9050732 -
Silicon hydride öryggi 1,0
“(∼2940 ∼2980 cm-1) cm-1) and two CH asymmetric and Becke's three parameters exchange hybrid functional B3LYP 3 stretching modes, a decrease in the intensity of, and a red-shift associated with the generalized gradient approximation (GGA) (∼”
Michalak 等 - 2008 - Investigation of the chemical purity of silicon su DOI: 10.1021/jp8030539
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